→ rdfs:label → "Omicron Twin SNOM System"^^xsd:string
→ dcterms:description → "The TwinSNOM combines conventional microscopy, SNOM, shear-force AFM and optionally even laser scanning confocal microscopy or Needle-Sensor AFM in a single instrument."^^xsd:string
→ skos:notation → "E10609"^^http://id.southampton.ac.uk/ns/equipment-code-scheme
→ rdfs:comment → "The TwinSNOM combines conventional microscopy, SNOM, shear-force AFM and optionally even laser scanning confocal microscopy or Needle-Sensor AFM in a single instrument."^^xsd:string
→ dc:description → "The TwinSNOM combines conventional microscopy, SNOM, shear-force AFM and optionally even laser scanning confocal microscopy or Needle-Sensor AFM in a single instrument."^^xsd:string
→ rdfs:label → "University of Southampton"^^xsd:string
→ rdfs:label → "School of Electronics & Computer Science"^^xsd:string
→ rdfs:label → "Physical Sciences and Engineering"^^xsd:string