→ rdfs:label → "Philips FEI XL30SEM Environmental Scanning Electron Microscope"^^xsd:string

→ dcterms:description → "The XL30 environmental SEM is capable of imaging at magnifications of up to 100,000, using an accelerating voltage of up to 30kV. Electrically conductive samples can be imaged using the secondary electron detector, while non-conducting materials may be studied, without the need for coating, with the gaseous secondary electron detector. Compositional information may be obtained using a backscattered electron detector, while elemental analysis can be performed with the energy dispersive X-ray spectroscopy (EDS) probe. The XL30 will be undergoing an upgrade in the spring of 2012 to replace the existing EDS probe and to additionally fit a waveform dispersive x-ray spectroscopy (WDS) system, which will give greatly enhanced x-ray resolution and light element analysis capability."^^xsd:string

→ skos:notation → "F10022"^^http://id.southampton.ac.uk/ns/equipment-code-scheme

→ rdfs:comment → "The XL30 environmental SEM is capable of imaging at magnifications of up to 100,000, using an accelerating voltage of up to 30kV. Electrically conductive samples can be imaged using the secondary electron detector, while non-conducting materials may be studied, without the need for coating, with the gaseous secondary electron detector. Compositional information may be obtained using a backscattered electron detector, while elemental analysis can be performed with the energy dispersive X-ray spectroscopy (EDS) probe. The XL30 will be undergoing an upgrade in the spring of 2012 to replace the existing EDS probe and to additionally fit a waveform dispersive x-ray spectroscopy (WDS) system, which will give greatly enhanced x-ray resolution and light element analysis capability."^^xsd:string

→ oo:contact → http://id.southampton.ac.uk/facility/F10022#secondary_contact

→ dc:description → "The XL30 environmental SEM is capable of imaging at magnifications of up to 100,000, using an accelerating voltage of up to 30kV. Electrically conductive samples can be imaged using the secondary electron detector, while non-conducting materials may be studied, without the need for coating, with the gaseous secondary electron detector. Compositional information may be obtained using a backscattered electron detector, while elemental analysis can be performed with the energy dispersive X-ray spectroscopy (EDS) probe. The XL30 will be undergoing an upgrade in the spring of 2012 to replace the existing EDS probe and to additionally fit a waveform dispersive x-ray spectroscopy (WDS) system, which will give greatly enhanced x-ray resolution and light element analysis capability."^^xsd:string

→ oo:formalOrganization → http://id.southampton.ac.uk/

→ oo:organizationPart → http://id.southampton.ac.uk/org/F6, http://id.southampton.ac.uk/org/EB

→ oo:primaryContact → http://id.southampton.ac.uk/facility/F10022#primary_contact

→ http://id.southampton.ac.uk/ns/facilityIsRCUKCosted → "true"^^xsd:boolean

http://id.southampton.ac.uk/equipment/E10176

→ http://data.ordnancesurvey.co.uk/ontology/spatialrelations/within → http://id.southampton.ac.uk/building/30

→ rdf:type → oo:Equipment

→ rdfs:label → "Fourier Transform Mass Spectrometer"^^xsd:string

→ dcterms:description → "Fourier 300 is a high-resolution NMR. Main Features:[nl]
- Compact high-resolution NMR spectrometer[nl]
- Ideal for chemistry education and chemical analysis[nl]
- Industry standard NMR software TopSpin[nl]
- Cost efficient[nl]
- Easy handling and siting[nl]
- Provides routine and advanced modern NMR techniques including COSY, NOESY, HSQC, HMBC"^^xsd:string

→ skos:notation → "E10176"^^http://id.southampton.ac.uk/ns/equipment-code-scheme

→ rdfs:comment → "Fourier 300 is a high-resolution NMR. Main Features:[nl]
- Compact high-resolution NMR spectrometer[nl]
- Ideal for chemistry education and chemical analysis[nl]
- Industry standard NMR software TopSpin[nl]
- Cost efficient[nl]
- Easy handling and siting[nl]
- Provides routine and advanced modern NMR techniques including COSY, NOESY, HSQC, HMBC"^^xsd:string

→ foaf:depiction → http://data.southampton.ac.uk/image-archive/equipment/raw/E10176-200147-P1000135.jpg, http://data.southampton.ac.uk/image-archive/equipment/raw/E10176-200147-P1000138.jpg, http://data.southampton.ac.uk/image-archive/equipment/raw/E10176-200147-P1000149.jpg, http://data.southampton.ac.uk/image-archive/equipment/raw/E10176-200147-P1000150.jpg, http://data.southampton.ac.uk/image-archive/equipment/raw/E10176-200147-Fourier%20Transform%20Mass%20Spec.jpg

→ oo:contact → http://id.southampton.ac.uk/equipment/E10176#secondary_contact

→ foaf:page → http://www.southampton.ac.uk/chemistry/business_partnership/services/ms.page?

→ dc:description → "Fourier 300 is a high-resolution NMR. Main Features:[nl]
- Compact high-resolution NMR spectrometer[nl]
- Ideal for chemistry education and chemical analysis[nl]
- Industry standard NMR software TopSpin[nl]
- Cost efficient[nl]
- Easy handling and siting[nl]
- Provides routine and advanced modern NMR techniques including COSY, NOESY, HSQC, HMBC"^^xsd:string

→ oo:formalOrganization → http://id.southampton.ac.uk/

→ oo:organizationPart → http://id.southampton.ac.uk/org/F6, http://id.southampton.ac.uk/org/EB

→ oo:primaryContact → http://id.southampton.ac.uk/equipment/E10176#primary_contact

http://id.southampton.ac.uk/equipment/E10645

→ http://data.ordnancesurvey.co.uk/ontology/spatialrelations/within → http://id.southampton.ac.uk/building/30

→ rdf:type → oo:Equipment

→ rdfs:label → "Spider Diffractometer (Rigaku)"^^xsd:string

→ dcterms:description → "The R-AXIS Spider diffractometer comprises a Molybdenum sealed tube X-ray generator and an RAPID image plate detector system with a quarter chi goniometer. Data collections are typically performed at 120K under a cold stream of nitrogen using a Oxford Cryosystems 600 Series CryoStream."^^xsd:string

→ skos:notation → "E10645"^^http://id.southampton.ac.uk/ns/equipment-code-scheme

→ rdfs:comment → "The R-AXIS Spider diffractometer comprises a Molybdenum sealed tube X-ray generator and an RAPID image plate detector system with a quarter chi goniometer. Data collections are typically performed at 120K under a cold stream of nitrogen using a Oxford Cryosystems 600 Series CryoStream."^^xsd:string

→ foaf:depiction → http://data.southampton.ac.uk/image-archive/equipment/raw/E10645-200924-P1000041.jpg, http://data.southampton.ac.uk/image-archive/equipment/raw/E10645-200924-P1000043.jpg

→ oo:contact → http://id.southampton.ac.uk/equipment/E10645#secondary_contact

→ foaf:page → http://www.southampton.ac.uk/sdc/small_mol_diffraction/equipment.page

→ dc:description → "The R-AXIS Spider diffractometer comprises a Molybdenum sealed tube X-ray generator and an RAPID image plate detector system with a quarter chi goniometer. Data collections are typically performed at 120K under a cold stream of nitrogen using a Oxford Cryosystems 600 Series CryoStream."^^xsd:string

→ oo:formalOrganization → http://id.southampton.ac.uk/

→ oo:organizationPart → http://id.southampton.ac.uk/org/F6, http://id.southampton.ac.uk/org/EB

→ oo:primaryContact → http://id.southampton.ac.uk/equipment/E10645#primary_contact

http://id.southampton.ac.uk/facility/F10020

→ http://data.ordnancesurvey.co.uk/ontology/spatialrelations/within → http://id.southampton.ac.uk/building/30

→ rdf:type → oo:Facility

→ rdfs:label → "JSM5910 Scanning Electron Microscope"^^xsd:string

→ dcterms:description → "The JSM5910 SEM is capable of imaging conductive samples at magnifications of up to 300,000 at accelerating voltages of up to 3kV. Images may be obtained using either the secondary electron detector or backscattered electron detector. Energy dispersive x-ray spectroscopy (EDS) may be carried out with the Oxford Inca 300 EDS system. Non-conductive samples may be gold coated in the adjacent sample preparation room for a small extra charge."^^xsd:string

→ skos:notation → "F10020"^^http://id.southampton.ac.uk/ns/equipment-code-scheme

→ rdfs:comment → "The JSM5910 SEM is capable of imaging conductive samples at magnifications of up to 300,000 at accelerating voltages of up to 3kV. Images may be obtained using either the secondary electron detector or backscattered electron detector. Energy dispersive x-ray spectroscopy (EDS) may be carried out with the Oxford Inca 300 EDS system. Non-conductive samples may be gold coated in the adjacent sample preparation room for a small extra charge."^^xsd:string

→ oo:contact → http://id.southampton.ac.uk/facility/F10020#secondary_contact

→ dc:description → "The JSM5910 SEM is capable of imaging conductive samples at magnifications of up to 300,000 at accelerating voltages of up to 3kV. Images may be obtained using either the secondary electron detector or backscattered electron detector. Energy dispersive x-ray spectroscopy (EDS) may be carried out with the Oxford Inca 300 EDS system. Non-conductive samples may be gold coated in the adjacent sample preparation room for a small extra charge."^^xsd:string

→ oo:formalOrganization → http://id.southampton.ac.uk/

→ oo:organizationPart → http://id.southampton.ac.uk/org/F6, http://id.southampton.ac.uk/org/EB

→ oo:primaryContact → http://id.southampton.ac.uk/facility/F10020#primary_contact

→ http://id.southampton.ac.uk/ns/facilityIsRCUKCosted → "false"^^xsd:boolean

http://id.southampton.ac.uk/facility/F10021

→ http://data.ordnancesurvey.co.uk/ontology/spatialrelations/within → http://id.southampton.ac.uk/building/30

→ rdf:type → oo:Facility

→ rdfs:label → "Gemini 2375 BET Apparatus"^^xsd:string

→ dcterms:description → "The Gemini BET analyser is a simple to use system for measuring the surface area of solid materials. It does this by measuring the difference between the rates of adsorption of analysis gas in the sample and a blank over a range of partial pressures. These measurements are used to automatically calculate the surface area using the Brunauer, Emmet and Teller (BET) method. As well as the Gemini analyser itself, the facility includes a sample preparation station and a 0.1mg balance"^^xsd:string

→ skos:notation → "F10021"^^http://id.southampton.ac.uk/ns/equipment-code-scheme

→ rdfs:comment → "The Gemini BET analyser is a simple to use system for measuring the surface area of solid materials. It does this by measuring the difference between the rates of adsorption of analysis gas in the sample and a blank over a range of partial pressures. These measurements are used to automatically calculate the surface area using the Brunauer, Emmet and Teller (BET) method. As well as the Gemini analyser itself, the facility includes a sample preparation station and a 0.1mg balance"^^xsd:string

→ oo:contact → http://id.southampton.ac.uk/facility/F10021#secondary_contact

→ dc:description → "The Gemini BET analyser is a simple to use system for measuring the surface area of solid materials. It does this by measuring the difference between the rates of adsorption of analysis gas in the sample and a blank over a range of partial pressures. These measurements are used to automatically calculate the surface area using the Brunauer, Emmet and Teller (BET) method. As well as the Gemini analyser itself, the facility includes a sample preparation station and a 0.1mg balance"^^xsd:string

→ oo:formalOrganization → http://id.southampton.ac.uk/

→ oo:organizationPart → http://id.southampton.ac.uk/org/F6, http://id.southampton.ac.uk/org/EB

→ oo:primaryContact → http://id.southampton.ac.uk/facility/F10021#primary_contact

→ http://id.southampton.ac.uk/ns/facilityIsRCUKCosted → "false"^^xsd:boolean