→ rdfs:label → "Leo 1455VP Scanning Electron Microscope (SEM)"^^xsd:string
→ dcterms:description → "A 30KV, LaB6(or tungsten filament) scanning electron microscope equipped with an Everhart-Thornley secondary electron detector and a cambridge four quadrant backscatter detector.␣␣Maximum resolution is 10nm depending on column conditions."^^xsd:string
→ skos:notation → "E10512"^^http://id.southampton.ac.uk/ns/equipment-code-scheme
→ rdfs:comment → "A 30KV, LaB6(or tungsten filament) scanning electron microscope equipped with an Everhart-Thornley secondary electron detector and a cambridge four quadrant backscatter detector.␣␣Maximum resolution is 10nm depending on column conditions."^^xsd:string
→ dc:description → "A 30KV, LaB6(or tungsten filament) scanning electron microscope equipped with an Everhart-Thornley secondary electron detector and a cambridge four quadrant backscatter detector.␣␣Maximum resolution is 10nm depending on column conditions."^^xsd:string
→ rdfs:label → "University of Southampton"^^xsd:string
→ rdfs:label → "School of Physics & Astronomy"^^xsd:string
→ rdfs:label → "Physical Sciences and Engineering"^^xsd:string
→ foaf:name → "LEBLANC, KATHLEEN"^^xsd:string
→ rdfs:label → "Clean Rooms - Nanofabrication"^^xsd:string