→ rdfs:label → "Leo 1455VP Scanning Electron Microscope (SEM)"
→ dcterms:description → "A 30KV, LaB6(or tungsten filament) scanning electron microscope equipped with an Everhart-Thornley secondary electron detector and a cambridge four quadrant backscatter detector.␣␣Maximum resolution is 10nm depending on column conditions."
→ skos:notation → "E10512"^^http://id.southampton.ac.uk/ns/equipment-code-scheme
→ dc:description → "A 30KV, LaB6(or tungsten filament) scanning electron microscope equipped with an Everhart-Thornley secondary electron detector and a cambridge four quadrant backscatter detector.␣␣Maximum resolution is 10nm depending on column conditions."
→ rdfs:comment → "A 30KV, LaB6(or tungsten filament) scanning electron microscope equipped with an Everhart-Thornley secondary electron detector and a cambridge four quadrant backscatter detector.␣␣Maximum resolution is 10nm depending on column conditions."
→ rdfs:label → "Physical Sciences and Engineering"