→ rdfs:label → "Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer (ARXPS) System"
→ dcterms:description → "The Theta Probe X-ray Photoelectron Spectromer (XPS) allows the collection of angle-resolved spectra without the need to tilt the sample to nondestructively characterize ultra-thin layers."
→ skos:notation → "E10712"^^http://id.southampton.ac.uk/ns/equipment-code-scheme
→ dc:description → "The Theta Probe X-ray Photoelectron Spectromer (XPS) allows the collection of angle-resolved spectra without the need to tilt the sample to nondestructively characterize ultra-thin layers."
→ rdfs:comment → "The Theta Probe X-ray Photoelectron Spectromer (XPS) allows the collection of angle-resolved spectra without the need to tilt the sample to nondestructively characterize ultra-thin layers."
→ rdfs:label → "Physical Sciences and Engineering"
→ rdfs:label → "School of Electronics & Computer Science"