→ rdfs:label → "Philips FEI XL30SEM Environmental Scanning Electron Microscope"^^xsd:string
→ dcterms:description → "The XL30 environmental SEM is capable of imaging at magnifications of up to 100,000, using an accelerating voltage of up to 30kV. Electrically conductive samples can be imaged using the secondary electron detector, while non-conducting materials may be studied, without the need for coating, with the gaseous secondary electron detector. Compositional information may be obtained using a backscattered electron detector, while elemental analysis can be performed with the energy dispersive X-ray spectroscopy (EDS) probe. The XL30 will be undergoing an upgrade in the spring of 2012 to replace the existing EDS probe and to additionally fit a waveform dispersive x-ray spectroscopy (WDS) system, which will give greatly enhanced x-ray resolution and light element analysis capability."^^xsd:string
→ skos:notation → "F10022"^^http://id.southampton.ac.uk/ns/equipment-code-scheme
→ rdfs:comment → "The XL30 environmental SEM is capable of imaging at magnifications of up to 100,000, using an accelerating voltage of up to 30kV. Electrically conductive samples can be imaged using the secondary electron detector, while non-conducting materials may be studied, without the need for coating, with the gaseous secondary electron detector. Compositional information may be obtained using a backscattered electron detector, while elemental analysis can be performed with the energy dispersive X-ray spectroscopy (EDS) probe. The XL30 will be undergoing an upgrade in the spring of 2012 to replace the existing EDS probe and to additionally fit a waveform dispersive x-ray spectroscopy (WDS) system, which will give greatly enhanced x-ray resolution and light element analysis capability."^^xsd:string
→ dc:description → "The XL30 environmental SEM is capable of imaging at magnifications of up to 100,000, using an accelerating voltage of up to 30kV. Electrically conductive samples can be imaged using the secondary electron detector, while non-conducting materials may be studied, without the need for coating, with the gaseous secondary electron detector. Compositional information may be obtained using a backscattered electron detector, while elemental analysis can be performed with the energy dispersive X-ray spectroscopy (EDS) probe. The XL30 will be undergoing an upgrade in the spring of 2012 to replace the existing EDS probe and to additionally fit a waveform dispersive x-ray spectroscopy (WDS) system, which will give greatly enhanced x-ray resolution and light element analysis capability."^^xsd:string
→ skos:notation → "30"^^http://id.southampton.ac.uk/ns/building-code-scheme
→ dcterms:spatial → "POLYGON((-1.39499515218213 50.9343006148694,-1.39483390458863 50.934513591837,-1.39467283665819 50.9344651880664,-1.3946178597628 50.9345377653971,-1.39420858731936 50.9344148028013,-1.39426994225326 50.9343337899742,-1.3942150551894 50.9343181648425,-1.39415567654912 50.9343005016438,-1.39411480320369 50.9342871976275,-1.39415414941314 50.9342352836212,-1.39429132215702 50.9342764977989,-1.39435438388997 50.9341929937608,-1.39431979875153 50.9341825769753,-1.3943507007973 50.9341417023925,-1.39427434399815 50.9341187741136,-1.39433228533398 50.9340442712822,-1.39455542685055 50.9341115842559,-1.39458785603231 50.9341213783137,-1.39457204568331 50.9341428912659,-1.39455309123082 50.9341678009876,-1.39459630019598 50.9341807653602,-1.39499515218213 50.9343006148694))"^^xsd:string
← is
foaf:depicts of
← https://data.southampton.ac.uk/image-archive/buildings/100/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/1000/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/1600/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/1920/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/200/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/220x220/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/240x260/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/300/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/320x198/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/400/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/480x297/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/50/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/600/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/800/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/800x600/30.jpg,
https://data.southampton.ac.uk/image-archive/buildings/raw/30.jpg
→ rdfs:label → "Faculty of Natural and Environmental Sciences"^^xsd:string
→ skos:notation → "EB"^^http://id.southampton.ac.uk/ns/alphaCode,
"A3EB000000"^^http://id.southampton.ac.uk/ns/10CharHRCode
→ rdfs:label → "Philips Xl30 ESEM Scanning Electron Microscope"^^xsd:string
→ dcterms:description → "Philips Environmental - Scanning Electron Microscope (SEM) coupled with FEI Micro-analysis system. The Philips XL-30 ESEM is a flexible scanning electron microscope with a large chamber. It can be used for conventional high vacuum imaging, or in the environmental mode, can be used to examine wet, oily, gassy or non-conducting samples. Samples can be examined in an atmosphere of up to 10 torr of water vapour, oxygen, nitrogen carbon dioxide or any other non-corrosice gas."^^xsd:string
→ skos:notation → "E10174"^^http://id.southampton.ac.uk/ns/equipment-code-scheme
→ rdfs:comment → "Philips Environmental - Scanning Electron Microscope (SEM) coupled with FEI Micro-analysis system. The Philips XL-30 ESEM is a flexible scanning electron microscope with a large chamber. It can be used for conventional high vacuum imaging, or in the environmental mode, can be used to examine wet, oily, gassy or non-conducting samples. Samples can be examined in an atmosphere of up to 10 torr of water vapour, oxygen, nitrogen carbon dioxide or any other non-corrosice gas."^^xsd:string
→ dc:description → "Philips Environmental - Scanning Electron Microscope (SEM) coupled with FEI Micro-analysis system. The Philips XL-30 ESEM is a flexible scanning electron microscope with a large chamber. It can be used for conventional high vacuum imaging, or in the environmental mode, can be used to examine wet, oily, gassy or non-conducting samples. Samples can be examined in an atmosphere of up to 10 torr of water vapour, oxygen, nitrogen carbon dioxide or any other non-corrosice gas."^^xsd:string
→ rdfs:label → "Thermo Magnaray WDS Spectrometer"^^xsd:string
→ dcterms:description → "Wavelentgh dispersive x-ray spectroscopy accessory for quantitative analysis of SEM specimens, using standards."^^xsd:string
→ skos:notation → "E10734"^^http://id.southampton.ac.uk/ns/equipment-code-scheme
→ rdfs:comment → "Wavelentgh dispersive x-ray spectroscopy accessory for quantitative analysis of SEM specimens, using standards."^^xsd:string
→ dc:description → "Wavelentgh dispersive x-ray spectroscopy accessory for quantitative analysis of SEM specimens, using standards."^^xsd:string