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Philips Xl30 ESEM Scanning Electron Microscope

Philips Environmental - Scanning Electron Microscope (SEM) coupled with FEI Micro-analysis system. The Philips XL-30 ESEM is a flexible scanning electron microscope with a large chamber. It can be used for conventional high vacuum imaging, or in the environmental mode, can be used to examine wet, oily, gassy or non-conducting samples. Samples can be examined in an atmosphere of up to 10 torr of water vapour, oxygen, nitrogen carbon dioxide or any other non-corrosice gas.

Facility:

Philips FEI XL30SEM Environmental Scanning Electron Microscope

Part of:

Faculty of Natural and Environmental Sciences
Chemistry and Chemical Engineering

Location:

Graham Hills

Contact

CLARK, ALISTAIR