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Imoxs Sem
X-ray fluorescence (XRF) analysis of glasses & high sensitivity trace analysis, spatial resolution 50um, sensitivity element dependant, down to 50ppm
- Facility:
- Clean Rooms - Nanofabrication
- Part of:
- School of Electronics & Computer Science
Physical Sciences and Engineering - Location:
- New Mountbatten
Contact
LESSEY, MARK
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