Leo 1455VP Scanning Electron Microscope (SEM)
A 30KV, LaB6(or tungsten filament) scanning electron microscope equipped with an Everhart-Thornley secondary electron detector and a cambridge four quadrant backscatter detector. Maximum resolution is 10nm depending on column conditions.
| Facility: | Clean Rooms - Nanofabrication |
| Part of: | School of Physics & Astronomy Physical Sciences and Engineering |
| Location: | Physics |
Contact
LEBLANC, KATHLEEN
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