Open Data Service
Leo 1455VP Scanning Electron Microscope (SEM)
A 30KV, LaB6(or tungsten filament) scanning electron microscope equipped with an Everhart-Thornley secondary electron detector and a cambridge four quadrant backscatter detector. Maximum resolution is 10nm depending on column conditions.
- Facility:
- Clean Rooms - Nanofabrication
- Part of:
- School of Physics & Astronomy
Physical Sciences and Engineering - Location:
- Physics
Contact
LEBLANC, KATHLEEN
If you have additions or corrections to a facility or equipment entry please contact your Faculty Finance Team.
Get the Data
You can download the raw data used to create this page:
The following open datasets were used to build this page:
© 2025 University of Southampton