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ECS - Characterisation (Measurement)

Photograph of New Mountbatten at the University of Southampton (thumbnail). — © 2010 François-Xavier Beckers. Photograph made available under a http://creativecommons.org/licenses/by/3.0/ license.

The clean room provides a range of characterisation equipment for device and material characterisation. Plan view imaging of a sample surface can be performed using field emission scanning electron microscopy (FESEM), helium ion microscopy and scanning probe microscopy. Cross-section imaging can be achieved by first making a cross-sectional cut using the focussed ion beam (FIB) system and then imaging in-situ using field emission scanning electron microscopy.

Contact

DE GROOT, CORNELIS - +442380592732

Information

RCUK Costed:: Yes
School/Dept:: School of Electronics & Computer Science
Building:: New Mountbatten

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