ECS - Characterisation (Measurement)
The clean room provides a range of characterisation equipment for device and material characterisation. Plan view imaging of a sample surface can be performed using field emission scanning electron microscopy (FESEM), helium ion microscopy and scanning probe microscopy. Cross-section imaging can be achieved by first making a cross-sectional cut using the focussed ion beam (FIB) system and then imaging in-situ using field emission scanning electron microscopy.
Contact
| DE GROOT, CORNELIS | |
 +442380592732 |
| RCUK Costed: | Yes |
| School/Dept: | School of Electronics & Computer Science |
| Building: | New Mountbatten |
If you have additions or corrections to a facility or equipment entry please contact your Faculty Finance Team.
Get the Data
If you're that way inclined, you can get the raw data used to create this page in various formats, as listed below.
| TTL | RDF/Turtle file |
| RDF | RDF/XML file |
| RDF.HTML | HTML visualisation of raw data |
The following open datasets were used to build this page:
| Facilities and Equipment |