Open Data Service, University of Southampton

Open Data Service

JSM5910 Scanning Electron Microscope

The JSM5910 SEM is capable of imaging conductive samples at magnifications of up to 300,000 at accelerating voltages of up to 3kV. Images may be obtained using either the secondary electron detector or backscattered electron detector. Energy dispersive x-ray spectroscopy (EDS) may be carried out with the Oxford Inca 300 EDS system. Non-conductive samples may be gold coated in the adjacent sample preparation room for a small extra charge.

Contact

BARTLETT, PHILIP
+442380592373
P.N.Bartlett@soton.ac.uk

Information

RCUK Costed:No
School/Dept:Natural and Environmental Sciences
Building:Synthetic Chemistry
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Facilities and Equipment