JSM5910 Scanning Electron Microscope
The JSM5910 SEM is capable of imaging conductive samples at magnifications of up to 300,000 at accelerating voltages of up to 3kV. Images may be obtained using either the secondary electron detector or backscattered electron detector. Energy dispersive x-ray spectroscopy (EDS) may be carried out with the Oxford Inca 300 EDS system. Non-conductive samples may be gold coated in the adjacent sample preparation room for a small extra charge.
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