EM Centre
The centre houses strategic research facilities for the microstructural characterisation of materials by high resolution imaging, crystallographyand nano/micro-area chemical analysis. Both scanning and transmission electron microscopes (SEM & TEM) are available. SEM (JSM6500F) has a resolution of 1.5nm for surface imaging and chemical microanalysis at micron scale. TEM (JEM 3010) has a resolution of 0.21nm with an accelerating voltage 300kv, high tilt polepieces (± 42 degrees) for crystallographic analysis at nano scale. The centre has a full range of preparation facilities including carbon coating, gold sputter coating, ion beam thinning, disc punch/grinding, mechanical dimpling and electropolishing.
Contact
| WANG, SIMIAO |
 +442380594638 |
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